Michalex is very pleased to introduce his high temperature instrumented indentation system (HTIIS) family. These instruments, developed by ONERA, the French Aerospace lab, are specifically devoted to very high temperature mechanical testing, up to 1000°C : HTIIS 1000 and 1200°C: HTIIS 1200. This unique combination of mechanical micro probe and temperature control technology allow the access of mechanical properties at nano and micro scale. To achieve these performances, specific technical solutions have been developed to overcome all the classical limitations related to very high temperature.
As any indentation system, the instrument basically measure load and displacement plus temperature. Regarding load, of course, all the load sensor concepts commonly used by commercial systems don’t support such high level of temperature due to the gradients and instability sources.
ONERA has then mixed load and displacement measurement to correct dilatation effects. The load sensor, based on a classical strain gage technology, is on the first hand positioned in a cold zone of the instrument and on the second hand, continuously corrected by a devoted displacement gage to correct any remaining thermal drift. Regarding displacement, a non contact sensor based on a capacitive gage, associated with a piezo transducer is used. This technique allows the lowest possible drift in association with a high stiffness device. Temperature is of course a key point. Different problems must be solved: temperature gradient between sample and tip, stability control during the test, measurement at the right position,…The design developed use the best possible compromise between all these problems ( right choice, positioning and control algorithms of temperature sensors) The result allows to achieve uncompromised level of performance in a temperature controlled mechanical testing system.
Last but not least, the software fully control the system and allows the user to design and analyse his own kind of experiment trough a well established standard and can be then easily shared by the scientific community.
unique capability to explore mechanical properties
One degree of freedom probe
Maintain compliance in the vertical direction without lateral interference
Nano and Micro load and displacement range
Access to local properties on an extended range with one probe
Optical microscopy on the complete temperature range
Access to contact area measurement up to 1000°C
xy table working on the complete temperature range
micro positioning accuracy at any temperature
Secondary vaccuum chamber and pumps
Device working under neutral gaz atmosphere without oxygen interaction
Temperature closed loop feedback
Temperature control allows an extremely precise sample homogeneity
Graphical software with intuitive flexible user interface
Plug-and-play test method allowing the user to get fast and efficient results